XC-0H Micro Series Line Camera 分辨率可達67,200dpi(375納米),非常適合晶圓表面高精度瑕疵檢測! Advanced and Unique Pixel Size up to 375nm, A Suitable Solution for Wafer Surface High Precision Defect Inspection.
XC-0H Micro Series Line Camera 分辨率可達67,200dpi(375納米),非常適合晶圓表面高精度瑕疵檢測! Advanced and Unique Pixel Size up to 375nm, A Suitable Solution for Wafer Surface High Precision Defect Inspection.